计算物理 ›› 2003, Vol. 20 ›› Issue (4): 372-376.

• 论文 • 上一篇    

MEDICI程序简介及其在电离辐照效应研究中的应用

郭红霞1,2, 陈雨生1, 周辉1, 张义门2, 龚仁喜2, 吕红亮2   

  1. 1. 西北核技术研究所, 陕西 西安 710024;
    2. 西安电子科技大学微电子所, 陕西 西安 710071
  • 收稿日期:2002-05-24 修回日期:2002-09-08 出版日期:2003-07-25 发布日期:2003-07-25
  • 作者简介:郭红霞(1964-),女,山西太原,副研究员,博士,主要从事半导体器件辐照效应研究,西安69信箱13分箱三室.

Brief Introduction of MEDICI Software and Its Application in Ionization Radiation Effects

GUO Hong-xia1,2, CHEN Yu-sheng1, ZHOU Hui1, ZHANG Yi-men2, GONG Ren-xi2, LÜ Hong-liang2   

  1. 1. Northwest Institute of Nuclear Technology, Xi'an 710024, China;
    2. Microelectronics Institute of Xidian University, Xi'an 710071, China
  • Received:2002-05-24 Revised:2002-09-08 Online:2003-07-25 Published:2003-07-25

摘要: 简要介绍了二维半导体器件模拟软件MEDICI的基本特点和使用方法;应用MEDICI程序对MOSFET的总剂量效应、PN结的剂量率效应进行了仿真模拟,建立了电离辐照效应的物理模型,并将模拟结果与实验数据进行了比较.

关键词: MEDICI程序, 器件模拟, 总剂量效应, 剂量率效应

Abstract: The MEDICI software of two dimensional simulation of semiconductor device is briefly introduced.Its characteristics and use are described.With the help of MEDICI,effects of total dose for MOSFET and dose rate for pn junction are simulated.Their physical models are set up.A theory approach is provided for the research of ionization radiation effects.

Key words: MEDICI software, device simulation, effects of total dose, effects of dose rate

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