计算物理 ›› 2002, Vol. 19 ›› Issue (4): 367-371.

• 论文 • 上一篇    下一篇

高能质子单粒子翻转效应的模拟计算

贺朝会, 陈晓华, 李国政   

  1. 西北核技术研究所, 陕西 西安 710024
  • 收稿日期:2001-01-02 修回日期:2001-04-23 出版日期:2002-07-25 发布日期:2002-07-25
  • 作者简介:贺朝会(1966-),男,陕西武功,副研,博士,主要从事半导体器件的核辐射效应方面的研究,西安69信箱13分箱710024.

SIMULATION CALCULATION OF SINGLE EVENT UPSET EFFECTS FOR HIGH ENERGY PROTONS

HE Chao-hui, CHEN Xiao-hua, LI Guo-zheng   

  1. Northwest Institute of Nuclear Technology, Xi'an 710024, China
  • Received:2001-01-02 Revised:2001-04-23 Online:2002-07-25 Published:2002-07-25

摘要: 在分析质子与硅反应的基础上,提出质子单粒子翻转截面理论计算模型,建立了模拟计算方法.计算得到了不同能量的高能质子在存储单元的灵敏区内沉积的能量.指出高能质子主要通过与硅反应产生的重离子在存储单元灵敏区内沉积能量,产生电荷,导致单粒子效应,得到了单粒子翻转截面与质子能量以及随临界电荷变化的关系.并将计算得到的单粒子翻转截面与实验数据进行了比较.

关键词: 质子, 单粒子翻转, Monte Carlo模拟

Abstract: A model and a simulating method for calculating the proton Single Event Upset (SEU) cross section are presented by the analysis of proton reactions in silicon. The energies deposited by protons of various energies are calculated in sensitive volume in memory cell. It is pro posed that high energy proton SEU is greatly attributed to the recoils (heavy ions), produced by proton reactions in silicon, which deposit ener gy and induce charge in sensitive volume. The relations of the SEU cross section vs. proton energy and critical charge have been obtained. The calculation results are in agreement with the experimental data.

Key words: proton, single event upset, Monte Carlo simulation

中图分类号: