缺陷关联参数红外检测Levenberg-Marquardt改进识别算法研究
吕事桂, 杨立, 范春利, 孙丰瑞, 王为清
A Modified Levenberg-Marquardt Algorithm for Relevant Parameter Identification of Defect with Infrared Inspection
LV Shigui, YANG Li, FAN Chunli, SUN Fengrui, WANG Weiqing
计算物理
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2013, (2): 214
-220
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