部分耗尽SOI晶体管电离辐射损伤的物理模型
何宝平, 刘敏波, 王祖军, 姚志斌, 黄绍艳, 盛江坤, 肖志刚
Physical Model for Ionizing Radiation Damage in Partially Depleted SOI Transistors
HE Baoping, LIU Minbo, WANG Zujun, YAO Zhibin, HUANG Shaoyan, SHENG Jiangkun, XIAO Zhigang
计算物理
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2015, (2): 240
-246
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DOI: TN386.1
