CHINESE JOURNAL OF COMPUTATIONAL PHYSICS ›› 1989, Vol. 6 ›› Issue (3): 366-370.
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Liu Wen, Liu Wenhan, Wu Ziqin
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Abstract: An imitative calculation on W/C,Mo/Si artificial multilayered films,have been made.The influences of total period numbers and deviation of period thickness on X-ray diffraction peak were given. Two difference deviations, random fluctuation and system linear deviation have been imitated, their influences on X-ray energy distinguish power have been compared.
Liu Wen, Liu Wenhan, Wu Ziqin. AN IMITATIVE CALCULATION OF W/C, Mo/Si ARTICIFIAL MULTILAYERED FILMS' STRUCTURES AND PROPERTIES AS X-RAY MONOHROMATORS[J]. CHINESE JOURNAL OF COMPUTATIONAL PHYSICS, 1989, 6(3): 366-370.
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http://www.cjcp.org.cn/EN/Y1989/V6/I3/366
