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Simulation of Electron Beam Tracing in the X-ray Source with Microbeam
WANG Kai-ge, NIU Han-ben, ZHOU Yan
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS    2003, 20 (1): 21-24.  
Abstract279)      PDF (143KB)(1071)      
The focal dimension of the X-ray source with microbeam is in proportion to the size of the e-beam focused on the target surface. The finite difference method is utilized to calculate the distribution of the electrical-field intensity. The track of the electron-beam is traced by using the Runge-Kutta method within the whole symmetrical system. As a result, the diameter of the electron beam focus is 0.6-1.0μm while the total high brightness emission of the LaB6 crystal cathode is 0.06-0.3mA.
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THE FLUORESCENCE ESCAPE EFFICIENCY OF CsI:Na(CsI:Tl) PHOSPHOR AND ITS CONVERTING FACTOR TO X-RAYS
XU Xiang-yan, NIU Han-ben
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS    2002, 19 (3): 195-202.  
Abstract263)      PDF (413KB)(1230)      
A model for the fluorescence escape efficiency of CsI:Na(CsI:Tl) phosphor is proposed,and the converting factor of CsI:Na(CsI:Tl) to X-rays is discussed in detail.Calculated results show that the fluorescence escape efficiency,as well as the converting factor,strongly depends on the substrate reflectivity and 1/(σL)(σ is the absorption coefficient of CsI:Na(CsI:Tl) to fluorescence, and L is the phosphor layer thickness.).For a phosphor,1/(σL) should be above 10,and 30~40 is even better.In point of converting factor and spatial resolution,the reflection model is superior to the transmission model.The maximum converting factor can be obtained by optimizing the phosphor layer thickness.
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STUDY OF SCATTERING PROPERTIES OF X RAYS IN INTENSIFIERS
GUO Jin-chuan, NIU Han-ben
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS    2000, 17 (3): 298-306.  
Abstract241)      PDF (362KB)(1018)      
The interaction processes of bremsstrahlung X rays with CsI:Na scintillator of different thickness(200~400 μm) are first simulated by means of Monte Carlo analysis. The energy spectra of exit photons from CsI:Na are presented, which are used as the incident spectra on iron, the constituents of the inner electrodes and shell of intensifiers. The backscattering properties of X rays in intensifiers are analyzed. The potential producing bremsstrahlung X rays is 20~120 kV. Results show that with the increase of X ray tube potential the number of backscattered photons gets bigger and their mean energies increase rapidly.
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