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AN IMITATIVE CALCULATION OF W/C, Mo/Si ARTICIFIAL MULTILAYERED FILMS' STRUCTURES AND PROPERTIES AS X-RAY MONOHROMATORS
Liu Wen, Liu Wenhan, Wu Ziqin
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS
1989, 6 (3):
366-370.
An imitative calculation on W/C,Mo/Si artificial multilayered films,have been made.The influences of total period numbers and deviation of period thickness on X-ray diffraction peak were given. Two difference deviations, random fluctuation and system linear deviation have been imitated, their influences on X-ray energy distinguish power have been compared.
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