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Simulation and Fabrication of High-Voltage 4H-SiC PiN Diode with JTE
ZHANG Fasheng, ZHANG Yuming
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS
2011, 28 (2):
306-312.
Reverse voltage characterizations of 4H-SiC PiN diodes with junction termination extension(JTE) are simulated by using a two-dimensional device simulator(ISE-TCAD 10).0.4H-SiC PiN diodes with JTE are fabricated with a planar fabrication process based on simulation.Good consistency between simulation and experiments was achieved.It shows that a 4H-SiC PiN diode with optimized JTE edge termination can reach a breakdown voltage of 1600 V,which is more than 90 percent of ideal parallel plane junction breakdown voltage.
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