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Simulation of Electron Beam Tracing in the X-ray Source with Microbeam
WANG Kai-ge, NIU Han-ben, ZHOU Yan
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS
2003, 20 (1):
21-24.
The focal dimension of the X-ray source with microbeam is in proportion to the size of the e-beam focused on the target surface. The finite difference method is utilized to calculate the distribution of the electrical-field intensity. The track of the electron-beam is traced by using the Runge-Kutta method within the whole symmetrical system. As a result, the diameter of the electron beam focus is 0.6-1.0μm while the total high brightness emission of the LaB6 crystal cathode is 0.06-0.3mA.
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