×
模态框（Modal）标题
在这里添加一些文本
Close
Close
Submit
Cancel
Confirm
×
模态框（Modal）标题
在这里添加一些文本
Close
×
导航切换
CJCP
Home
About Journal
About Journal
Information
Aims & Scopes
Journal History
Editorial Board
Editorial Board
Successive Editorial Board
Authors
Guidelines for Authors
Authors Login
Download
Online First
Reviewers
Peer Review
Editor Work
Editor-in-chief
Guidelines for Reviewers
FAQ
FAQ
Contacts us
中文
Simulation of MOS Devices in Radiation and Post-irradiation
HE Baoping, ZHANG Fengqi, YAO Zhibin
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS . 2007, (
1
): 109 -115 .
