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中文
Physical Model for Ionizing Radiation Damage in Partially Depleted SOI Transistors
HE Baoping, LIU Minbo, WANG Zujun, YAO Zhibin, HUANG Shaoyan, SHENG Jiangkun, XIAO Zhigang
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS . 2015, (
2
): 240 -246 . DOI: TN386.1
