CHINESE JOURNAL OF COMPUTATIONAL PHYSICS ›› 2019, Vol. 36 ›› Issue (4): 427-439.DOI: 10.19596/j.cnki.1001-246x.7881

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Influences of c/uA and mi/me on Magnetic Reconnection Process

QIAN Renfeng   

  1. Institute for Fusion Theory and Simulation, Zhejiang University, Hangzhou 310027, Zhejiang, China
  • Received:2018-04-10 Revised:2018-05-31 Online:2019-07-25 Published:2019-07-25

Abstract: A finite difference scheme to control divergence error of electromagnetic field is proposed to study magnetic reconnection. With this simple numerical scheme, divergence errors of electromagnetic field are limited in the magnitude of rounding error. Our results are in good agreement with that in GEM. Influences of c/uA and mi/me on magnetic reconnection are also studied. It indicated that with the increase of c/uA, net charge densities decrease while reconnection rate remains almost unchanged. The increase of mi/me could lead to current sheet thinning and acceleration of reconnection.

Key words: finite difference method, divergence error of electromagnetic field, magnetic reconnection, speed of light, ion to electron mass ratio

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