CHINESE JOURNAL OF COMPUTATIONAL PHYSICS ›› 1987, Vol. 4 ›› Issue (3): 307-316.

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ON THE METHOD OF ATOMIC RADIUS DETERMINATION IN SCF-Xα-SW CALCULATION

Tang Jing-chang1, Chen Yi-bing2   

  1. 1. Physics department of Zhe Jiang University;
    2. Technique school of Hangzhou Automobile Motor Factory
  • Received:1987-01-30 Online:1987-09-25 Published:1987-09-25

Abstract: The electronic structures of impurity in silicon have been studied by SCF-Xα-SW method, it is shown that the electronic structure is depending strongly on the atomic radius in the cluster. We have proposed two rules to determine the atomic radius:1) Adjusting the atomic radius of master element according to the band properties of crystal;2) Determining the radius of impurities in terms of minimizing the total energy of cluster.The calculations of electronic structure of Si:Pd and Si:Pd systemsshave demonstrated that these rules are efficient.