CHINESE JOURNAL OF COMPUTATIONAL PHYSICS ›› 2010, Vol. 27 ›› Issue (2): 240-244.

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Improved Perturbation Approach and Fast Wavelet Galerkin BEM for Capacitance Extraction

XIAO Jinyou1, CAO Yanchuang1, TAUSCH Johannes2, ZHANG Duo1   

  1. 1. College of Astronautics, Northwestern Polytechnical University, Xi'an 710072, China;
    2. Department of Mathematics, Southern Methodist University, Dallas, TX 75275, USA
  • Received:2008-10-20 Revised:2009-05-16 Online:2010-03-25 Published:2010-03-25

Abstract: We describe an improved perturbation approach for electrostatic analysis of three-dimensional structures consisting of dielectrics with high-permittivity ratios. Unlike original perturbation approach, the new approach uses only one system matrix with different right hand sides. A fast wavelet Galerkin boundary element method (WGBEM) is used to solve integral equations. Compared with wavelets defined in parameter spaces in a conventional WGBEM, the wavelets here are directly constructed on usual boundary element triangulation. It enables the proposed WGBEM to solve electrostatic problems in complicated geometries, unstructured meshes and comparatively coarse discretizations. Numerical results show that the improved perturbation approach combined with WGBEM has high accuracy and almost linear computational complexity.

Key words: capacitance extraction, equivalent charge formulation, high-permittivity ratio, wavelet Galerkin BEM

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