CHINESE JOURNAL OF COMPUTATIONAL PHYSICS ›› 2013, Vol. 30 ›› Issue (2): 214-220.

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A Modified Levenberg-Marquardt Algorithm for Relevant Parameter Identification of Defect with Infrared Inspection

LV Shigui, YANG Li, FAN Chunli, SUN Fengrui, WANG Weiqing   

  1. College of Power Engineering, Naval University of Engineering, Wuhan 430033, China
  • Received:2012-07-04 Revised:2012-10-21 Online:2013-03-25 Published:2013-03-25

Abstract: To overcome disadvantage of Levenberg-Marquardt(LM) algorithm,which can not keep geometric correlation of defect parameters,a modified method with fast convergence is presented.In a heat transfer model for a two-dimensional test piece with a subsurface rectangular defect,numerical experiments are conducted to verify effectiveness of the modified LM algorithm.Factors of initial guess and infrared temperature measurement error are considered.Conclusions are drown as follows: The modified LM algorithm keeps geometric correlation of defect parameters well and influence of initial guess is negligible;Identification accuracy of different defect parameters differs due to infrared temperature measurement errors.

Key words: Inverse heat conduction, Levenberg-Marquardt method, defect identification, infrared inspection

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