CHINESE JOURNAL OF COMPUTATIONAL PHYSICS ›› 2011, Vol. 28 ›› Issue (1): 145-151.

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Evaluation of DC I-V Characteristics and Small Signal Parameters of 4H-SiC Metal-Semiconductor Field Effect Transistors

WANG Ping1,2, YANG Yintang3, LIU Zengji1, SHANG Tao1, Guo Lixin2   

  1. 1. School of Telecommunications Engineering, State Key Laboratory on Integrated Services Networks, Xidian University, Xi'an 710071, China;
    2. School of Science, Xidian University, Xi'an 710071, China;
    3. School of Microelectronics, Xidian University, Xi'an 710071, China
  • Received:2009-12-23 Revised:2010-08-05 Online:2011-01-25 Published:2011-01-25

Abstract: With analysis on internal carrier transport mechanism in silicon carbide(SiC),an improved analytical model for dc current voltage and small signal parameters of 4H-SiC metal-semiconductor field effect transistor(MESFET) is proposed considering carrier velocity saturation and charge controlling.Incomplete dopant ionization and parasitic drain-source resistances are considered simultaneously.The simulated maximum transconductance is 48 mS·mm-1 at a gate voltage of 0 V.Simulations and physical measurements show good agreement.The model is simple in calculation and distinct in physical mechanism.It is suitable for design and research of SiC devices and circuits.

Key words: silicon carbide, metal-semiconductor field effects transistor, current voltage characteristics, small signal parameters, model

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