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The Coarse Dispersion of SiC/SiO2 Fractal Interface
CHEN Wen-jian, XIE Jia-chun, XU Jun, HU Lin-hui, DONG Xiao-bo
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS
2004, 21 (4):
311-315.
A fractal model of coarse surface of SiC by using structure function is presented.Three parameters rms roughness Δ,fractal dimension D,and correlative length L are used to describe the covariance function of surface height.The method calculating these parameters is also given.With the present model,one can calculate the coarse dispersion of SiC/SiO2 fractal interface to channel electrons.
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