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A CALCULATION PROGRAM OF DETERMINING THICKNESSES OF THIN FILMS ON SUBSTRATES BY MONTE CARLO SIMULATION
He Yan-cai, Huang Yue-hong, Ha Min
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS
1987, 4 (3):
380-384.
On the basis of author's theories and calculation method[1,2,3],we made a evaluation program of determining thicknesses of thin films on substrates.The software can be conveniently operated,and have already been extensively applied to the calculations for determining thicknesses of avariety of film materials.
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