|
Influences of c/uA and mi/me on Magnetic Reconnection Process
QIAN Renfeng
CHINESE JOURNAL OF COMPUTATIONAL PHYSICS
2019, 36 (4):
427-439.
DOI: 10.19596/j.cnki.1001-246x.7881
A finite difference scheme to control divergence error of electromagnetic field is proposed to study magnetic reconnection. With this simple numerical scheme, divergence errors of electromagnetic field are limited in the magnitude of rounding error. Our results are in good agreement with that in GEM. Influences of c/uA and mi/me on magnetic reconnection are also studied. It indicated that with the increase of c/uA, net charge densities decrease while reconnection rate remains almost unchanged. The increase of mi/me could lead to current sheet thinning and acceleration of reconnection.
Reference |
Related Articles |
Metrics
|
|